Jan Gaudestad

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semiconductor manufacturing semiconductor test solutions automated test equipment ate technology cmos image sensor dps pmu pin electronics system on chip high voltage low power design high density energy efficiency custom skus test functions power supply unit electronic test integrated circuits reduced cost data acquisition low leakage programming capabilities quattro operation voltage clamps programmable drivers window comparators high-speed inputs monitoring systems over-temperature protection calibration central monitoring hardware solutions advanced signal processing application-specific integrated circuits multi-channel testing data logging real-time monitoring analog components test automation next generation testing cost-effective testing performance verification integrated circuit design low-noise operation deskw technology high-speed operation signal conditioning semiconductors hardware environmental services renewables & environment