Dirk Meier

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application specific integrated circuit design radiation detection asic design validation analogue & digital electronics analogtodigital converters asic adc lna csa roic tmr sipm readout pmt readout fpa readout microbolometer readout czt readout image sensor readout gamma camera xray line scanner spectrometer radiation monitor infrared image sensor microbolometers semiconductor manufacturing imaging systems integrated circuits asic development mixed-signal asic custom ic design frontend ics gamma spectroscopy x-ray imaging environmental monitoring healthcare applications space applications security systems test & validation production support system development charge sensitive amplifiers low-noise amplifiers digital data interfaces energy resolution photon timing energy spectroscopy sensor integration nuclear medicine scientific research space radiation monitoring industrial tomography real-time monitoring data acquisition test verification validation techniques radiation hardened design application specific integrated circuits czt detectors sensors & detectors spectroscopic detectors ccds & cmos microelectronics assembly production of asics low-energy x-ray sources environmental testing cryogenic asics high-resolution imaging system integration multi-layer masks prototype device fabrication quality assurance standards supply chain management global distribution new product development semiconductors hardware logistics & supply chain