Hamed Sadeghian

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high-throughput metrology 3d scanning probe microscopy atom-scale precision semiconductor manufacturing non-destructive testing advanced packaging metrology feedforward trajectory planner subsurface measurements quantum technology high-speed imaging automated probe exchange wafer inspection acoustic microscopy real-time process monitoring gaa fets advanced imaging modes high aspect ratio metrology precision measurement mechatronic systems atomic force microscopy data visualization high resolution system reliability optical detection multi-head spms wafer scanning technology high accuracy sample-to-sample variation scanning stage dynamics vibration isolation automated alignment mechatronic innovations sub-angstrom precision electromechanical interactions advanced materials nanoelectronics high-performance sensors data processing innovations custom measurement solutions high sampling rates daringly innovative solutions next-generation devices industry-leading throughput advanced metrology techniques silicon-based technology revolutionary instrumentation semiconductors hardware information technology & services material science