David Lindblom

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xray tubes xray ebeam technology electron optics xray sources industrial machinery manufacturing x-ray sources metaljet nanotube microfocus x-ray high brightness x-ray battery inspection semiconductor inspection additive manufacturing material science biomedical imaging pharmaceutical research drug discovery 3d imaging ct scanning phase-contrast imaging x-ray microscopy scattering & diffraction high pressure xrd powder x-ray diffraction protein crystallography small molecule crystallography small angle x-ray scattering spectroscopy fluorescence liquid-metal-jet anode high resolution imaging custom x-ray sources oem solutions spark disclosure imaging image acquisition speed precision inspection nanometer precision quality control automotive inspection aerospace components advanced materials radiation shielding dynamic adaptation technology cathode lifetime graphical user interface remote operation high throughput electron beam technology advanced x-ray systems target materials x-ray flux x-ray performance analytical systems high stability sources